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1742
final/SRAM.jelib
@@ -26,8 +26,8 @@
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.subckt wire iot iof len=10 wid=10
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.param rr=0.8
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.param cc = '200e-15'
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.param rr=0.4
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.param cc = '100e-15'
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rt iot iof 'rr*len*50/(wid)'
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cf iof 0 'cc*len*wid*50/1e6'
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@@ -179,7 +179,7 @@ Xpct btt clk vdd pp ww='100'
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Xpcf bff clk vdd pp ww='100'
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.ends write1
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.subckt iWrite1 btt bff dii rwt clk
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.subckt iWrite1 btt bff dii rwt en clk
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* TODO: sizes
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Xclk clkb clk inv size='40'
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Xdii diib dii inv size='40'
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@@ -268,7 +268,7 @@ Xh2 nn1 dot inv size='60'
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.subckt decModel choose din clk size='20'
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Xi1 nn1 din inv size='size'
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* Here: stopped using i1 and just used din
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Xnal ww1 gnd din nnd2 size='size'
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Xnal ww1 gnd din nnd2 size='size*4'
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Xnar nn2 vdd din nnd2 size='size'
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Xnrl ww2 nn2 vdd nor2 size='size*3'
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Xnrr nn3 nn2 gnd nor2 size='size'
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BIN
final/amp.png
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After Width: | Height: | Size: 53 KiB |
BIN
final/decoder.png
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After Width: | Height: | Size: 11 KiB |
BIN
final/layout_arrayed.png
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After Width: | Height: | Size: 394 KiB |
BIN
final/layout_arrayed_closeup.png
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After Width: | Height: | Size: 100 KiB |
BIN
final/layout_single.png
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After Width: | Height: | Size: 210 KiB |
BIN
final/read_select.png
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After Width: | Height: | Size: 24 KiB |
354
final/report.tex
@@ -2,11 +2,25 @@
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\usepackage[margin=1in]{geometry}
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\usepackage{graphicx}
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\usepackage{amsmath}
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\usepackage{hyperref}
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\usepackage{xcolor}
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\usepackage{caption}
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\usepackage{subcaption}
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\definecolor{link}{HTML}{006275}
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\hypersetup{
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colorlinks,
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citecolor=black,
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filecolor=black,
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linkcolor=link,
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urlcolor=black
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}
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\title{Final Project Report}
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\author{Danila Fedorin}
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\begin{document}
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\maketitle
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\section*{General Design and Considerations}
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\tableofcontents
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\pagebreak
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\section{General Design and Considerations}
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The goal of this assignment was to create a 256-byte SRAM memory unit. In order
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to minimize wire delays, I chose to split each bit into \textbf{4 columns of 64 SRAM cells
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each}. This was motivated by the following factors:
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@@ -18,7 +32,7 @@ each}. This was motivated by the following factors:
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the decision to shrink the columns as much as possible. However...
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\item \emph{Smaller} columns became a routing challenge. Even with a 4-column split,
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to properly connect each cell of the SRAM column, the SRAM cells themselves need
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to accomodate an additional three \textsc{Wl} lines. Due to the pitch requirements
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to accommodate an additional three \textsc{Wl} lines. Due to the pitch requirements
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on metals three and four, this is the upper limit (for reasonably sized cells).
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Alternatives included splitting the decoder into pieces, but for large numbers
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of columns, this meant that the decoder signal traveled through significant amounts
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@@ -33,7 +47,7 @@ changes:
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\begin{itemize}
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\item I added \textbf{additional precharge transistors} along the column, a total of 4.
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Each was sized at $5\lambda$, much like the SRAM transistors themselves. When the clock
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Each was sized at $10\lambda$, much like the SRAM transistors themselves. When the clock
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was low, these PMOS transistors became transparent, and helped precharge the bitlines faster.
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Doing so helped avid hysteresis. However, this did not help with writing during high clock,
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so...
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@@ -45,43 +59,329 @@ changes:
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configuration, I did not place it in the middle of the column, as that would needlessly
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increase the length of the wires.
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\end{itemize}
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This led to the configuration shown in Figure \ref{fig:top-design}. To simulate this design, I placed
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a memory cell at the very top of my column, which is the furthest spot from both the read and write
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circuit. I also split the wire into 4 equally-sized fragments, each with resistance $\frac{R}{4}$ and
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capacitance $\frac{C}{4}$. Between each fragment, I added the aforementioned $5\lambda$ precharge
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%
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This led to the configuration shown in Figure \ref{fig:top-design}. To simulate this design, I \textbf{tested three configurations}:
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\begin{enumerate}
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\item A memory cell at the very top of my column, which is the furthest spot from both the read and write.
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This is the simulation in the figure.
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\item A memory cell in the middle of my column, in the same place as the write block. Since the write block
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has brief ``false starts'', this test was to ensure that the read block can still pick up data
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despite the write block's misfires.
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\item A memory cell at the very bottom of my column. This area has additional capacitance from the read block;
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it thus takes longer to charge up, and tends to be the first spot where writes fail.
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circuit.
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%
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\end{enumerate}
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I also split the wire into 4 equally-sized fragments, each with resistance $\frac{R}{4}$ and
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capacitance $\frac{C}{4}$. Between each fragment, I added the aforementioned $10\lambda$ precharge
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transistors, as well as 16 always-off $5\lambda$ transistors, which simulated the remaining memory cells.
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I also placed \textsc{Din}, \textsc{Ad0}, and \textsc{Rwt} behind the default-sized flip-flops
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attached to the clock to simulate something like a pipeline stage. My overall design is shown
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in figure \ref{fig:top-design-sim}.
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in Figure \ref{fig:top-design-sim}.
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\pagebreak
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\section*{Performance Results}
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I made three measurements of my performance.
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\begin{figure}[h]
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\centering
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\includegraphics[width=\linewidth]{toplevel_design.png}
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\caption{Top-level design for a single bit.}
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\label{fig:top-design}
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\end{figure}
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\begin{itemize}
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\item Without flip-flopping my inputs and outputs, I was able to clock my design around
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950\textit{ps}.
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\item With flip-flops on my inputs (but not on my output), I was able to clock my design
|
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around 1.24\textit{ns}. However, at this delay, the output of the gate came in very close to
|
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the falling edge of the clock.
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\item With flip-flops on my inputs and my outputs, I was able to clock my design at 2.6\textit{ns}.
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This significant delay was to allow enough setup time for the flip flop.
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\end{itemize}
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My SRAM cell ended up being $30\lambda$ units tall when arrayed. With
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a total of 64 cells in a single column, this led to a wire length of $1920\lambda$.
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However, since my write block was now included in the column, I added another $300\lambda$
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of length to this number, to a total of roughly $2200\lambda$.
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\begin{figure}
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\centering
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\includegraphics[width=0.6\linewidth]{toplevel.png}
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\caption{Architecture of top-level simulation.}
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\label{fig:top-design-sim}
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\end{figure}
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\pagebreak
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\section{Performance Results}
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I was able to clock my design at \textbf{$1.3\textit{ns}$}.
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%
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Two factors lead to these upper limits.
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I realize that this isn't as fast as everyone else, but I ask that you take
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into consideration the fact that \textbf{I was working with the old wire model}
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until about an hour before the final due date (since I didn't know the wire model changed).
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If I knew earlier, I'd have more time to optimize my design for the timings associated
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with the new model.
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%
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Two factors lead to this upper limit.
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%
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\begin{itemize}
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\item \textit{Write capacitance} makes it increasingly difficult to overwrite the value
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in the cell. Clocking my design any faster than 950\textit{ps} or 1.24\textit{ns}
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(depending on the case) leads my cell to \textit{almost} flip, but not resolve correctly.
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in the cell. Clocking my design any faster leads my cell to \textit{almost} flip, but not resolve correctly.
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I have found no way to work around these limits once my wire was properly sized, and my
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write block was placed in the middle of the column.
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\item \textit{Flop, decoder, and read delays} are the major limitation when both the inputs
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and the outputs of the circuit are connected to flip flops. Even though the output
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of the read block is correct, it doesn't arrive fast enough to be captured by the next cycle.
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Furthermore, in some cases, the signal to open a memory cell arrives later than the
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\textsc{Trig} signal for the senseamp, making it read too early and thus output the incorrect value.
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and the outputs of the circuit are connected to flip flops. The most significant
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instance of this issue is my write block: both \textsc{Din} and \textsc{Rwt} arrive
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around $300\textit{ps}$ into the cycle. This means two things: a) if the previous
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operation was ``read'', then the block does not start writing until halfway into
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the positive phase of the clock and b) if the data being written is different
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from the data in the previous cycle, for half the time, the write block will write
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the old data (until the flip flop switches).
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\end{itemize}
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\section{Components}
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\subsection{Decoder}
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\subsubsection{In My Own Words}
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The decoder in this design is \textit{almost} the exact same one as we were given in lecture.
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It computes all combinations of two consecutive bits using a \textsc{Nand} gate; for
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each combination, there are 4 adjacent two-bit combinations,
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||||
leading to a 4 \textsc{Nor} gates connected to each \textsc{Nand}. There are now
|
||||
16 combinations of 4 adjacent bits; each combination of the lower 4 bits
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needs to be compared with each of the 16 combinations of the upper 4 bits,
|
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leading to 16 \textsc{Nand} gates connected to each \textsc{Nor}. This
|
||||
results in 256 unique \textsc{Wl} wires. Finally, these need to be attached
|
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to the clock, so that cells aren't open randomly. This is done using an \textsc{And}
|
||||
gate (a \textsc{Nand} followed by an inverter).
|
||||
|
||||
I adjusted this design to account for the address signals that need to be fed
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into the write blocks. Which of the read/write columns is triggered
|
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depends on the upper two bits of the address (since we have 4 columns). I modeled
|
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this by increasing the fanout on the first \textsc{Nand} gate from 1 to 4.
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This is pessimistic; each 2-bit combination would only feed into one write block,
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whose trigger gate is normally sized.
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\begin{figure}[h]
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\centering
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||||
\includegraphics[width=\linewidth]{decoder.png}
|
||||
\caption{Decoder model used in project.}
|
||||
\label{fig:decoder}
|
||||
\end{figure}
|
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|
||||
% TODO: Domino logic
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% TODO: More inverters?
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\pagebreak
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||||
\subsection{Read Block}
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\subsubsection{In My Own Words}
|
||||
The read block uses a \emph{sense amplifier} to detect small changes on the bitlines,
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which it then translates into a zero-or-one output. The changes in the wires are below
|
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the threshold of what could be considered digital logic; all the sense amplifier
|
||||
designs I've come across rely on metastability, a state in which even tiny fluctuations
|
||||
can significantly alter the outcome\footnote{My favorite analogy is a pencil balanced on its tip.
|
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Technically, it's stable; however, even a small air current -- one you can't feel -- can knock it over.}.
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The \textsc{Trigger} signal, which depends on the clock and \textsc{Rwt}, puts the amplifier
|
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into a metastable state. From there, the connected bitlines cause it to resolve one way
|
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or another. Finally, if one of the wires resolves, a value is written into the keeper circuit
|
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at the end, which ensures that the value that was read continues to be expressed until
|
||||
the next read operation.
|
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|
||||
\subsubsection{Details}
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||||
For my read block, I used a different sense amplifier design. The design based
|
||||
on the two \textsc{Nand3} gates was easy to understand and build, but was less
|
||||
sensitive, and tended to behave strangely under pressure. This led to difficulties
|
||||
with debugging (the output would, for instance, flip completely at certain
|
||||
wire widths), and was seemingly random. Instead, I used
|
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an \textbf{improved latch-based sense amplifier design} from \cite{210039}. % TODO: cite
|
||||
The design I used is shown in Figure \ref{fig:latch-amp}.
|
||||
I left it sized at $40\lambda$, since larger amplifiers seem to take longer
|
||||
to trigger and exit metastability.
|
||||
|
||||
The read block is not a particular bottleneck in this design. The main concern
|
||||
was to handle the \textbf{``false start'' activation of the write block}. Because the \textsc{Rwt}
|
||||
input is behind a latch, it takes nearly $300\textit{ps}$ to pull up or down after
|
||||
the initial clock. Thus, if a write occurred during a previous cycle, the write block will
|
||||
activate for a short period of time before the read block does. The memory cell
|
||||
will overpower this initial misfire\footnote{According to my additional simulations, this is true even when the memory cell is close to the write block.}, but in this case, both \textsc{Bt} and \textsc{Bf}
|
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will be below \textsc{Vdd}. The ``improved sense amplifier'' seems to handle this
|
||||
case better than the one based on two \textsc{Nand} gates.
|
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|
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The latch-induced delay in \textsc{Rwt} also causes a strange \textsc{Trigger} signal during write operations
|
||||
directly following read operations. The trigger signal initialy activates, putting the sense
|
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amplifier into metastability; however, the correct \textsc{Rwt} value arrives before the
|
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sense amp's outputs are compromised. If this became a problem, I would add an additional,
|
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delayed clock signal \emph{after} the sense amplifier, and use an \textsc{And} gate
|
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to delay the read block's output.
|
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|
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\begin{figure}[h]
|
||||
\centering
|
||||
\begin{subfigure}{.5\textwidth}
|
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\centering
|
||||
\includegraphics[width=.7\linewidth]{amp.png}
|
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\caption{The latch-based sense amplifier from \cite{210039}.}
|
||||
\label{fig:latch-amp}
|
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\end{subfigure}%
|
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\begin{subfigure}{.5\textwidth}
|
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\centering
|
||||
\includegraphics[width=.8\linewidth]{read_select.png}
|
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\caption{The block gathering signals from the four columns.}
|
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\label{fig:read-collect}
|
||||
\end{subfigure}
|
||||
\caption{Read block schematics}
|
||||
\label{fig:read}
|
||||
\end{figure}
|
||||
|
||||
\pagebreak
|
||||
\subsection{Write Block}
|
||||
\subsubsection{In My Own Words}
|
||||
The write block converts a ``data in'', or \textsc{Din}, signal
|
||||
into a one-hot representation. It does so by pulling one of the bitlines high, and the other
|
||||
low. Once the memory cell connects to the bitlines, it takes on the charge provided by the
|
||||
write block, and is therefore overwritten. In my design, two PMOS transistors for each bitline
|
||||
are used to pull down; one of the transistors is triggered by the \textsc{Din} signal (which wire
|
||||
we pull down depends on the signal itself!), and the other by a combination of the clock
|
||||
and \textsc{Rwt} (we don't want to touch the wires when reading!).
|
||||
|
||||
\subsubsection{Details}
|
||||
My write block was not significantly different from the original design. Under the assumption
|
||||
that data arrives first, I placed the transistors attached to \textsc{Din} and $\overline{\textsc{Din}}$
|
||||
close to \textsc{Gnd}, each followed by a transistor attached to the ``write'' signal.
|
||||
I also configured the write block to only precharge when the clock is low.
|
||||
|
||||
I experimented with making the write block pull wires up when writing (during high clock). However,
|
||||
I did not find this to be of significant use. Since the wires are initially precharged,
|
||||
there is no more time spent on charging them up; furthermore, the memory cell being written to
|
||||
does not have enough ``strength'' to pull the wire down enough.
|
||||
|
||||
A curiosity of this design is that reads didn't seem to work with hich clock speeds. When enough
|
||||
time is spent reading the wires, the memory cell in question is able to gradually exhaust the amount
|
||||
of charge on one of these wires. Since the original, \textsc{Nand}-based sense amplifier required
|
||||
all inputs to be high to properly function, this led to it eventually ``flipping'' and producing
|
||||
the wrong output. This was only an issue above $5\textit{ns}$, and only with the original sense amplifier
|
||||
design, though. I think that both Reed and
|
||||
Graham experienced this occurrence -- they seemed to post very similar waveforms
|
||||
to the community Discord group chat.
|
||||
|
||||
One thing to note about the write block is that its \textbf{clock input is deliberately delayed} compared
|
||||
to the ``actual'' clock. This is because of an issue with \textsc{Din}. Since this
|
||||
input is behind a latch, it takes around $300\textit{ps}$ to arrive after the rising clock
|
||||
edge. If the previous value of \textsc{Din} was different than its current one, the write
|
||||
block will start writing the wrong value. This will typically mean that the block cannot properly
|
||||
perform the write. The delay on the clock input serves to mitigate this issue, by giving more
|
||||
time for \textsc{Din} to settle before starting to write. To compensate for this delay, I sized
|
||||
the write block's pull down transistors quite large ($100\lambda$), so that they can pull
|
||||
the wire down, even starting $300\textit{ps}$ into the cycle. This is why the ``clock'' input
|
||||
in my diagrams is colored black, unlike every other clocked component. The delay is achieved
|
||||
by 6 sequenced inverters, two of which are sized 10x larger than the rest.
|
||||
|
||||
\begin{figure}[h]
|
||||
\centering
|
||||
\includegraphics[width=0.65\linewidth]{write.png}
|
||||
\caption{Write block used in this project.}
|
||||
\label{fig:write}
|
||||
\end{figure}
|
||||
|
||||
\pagebreak
|
||||
\subsection{Memory Cell}
|
||||
\subsubsection{In My Own Words}
|
||||
The memory cell consists of two cross coupled inverters whose outputs
|
||||
are disconnected from the bitlines by two additional nMOS transistors. When disconnected,
|
||||
this cell reliably holds its value; one inverter's output turns off the other, and symmetrically,
|
||||
the ``off'' output of that other inverter keeps the first one on. However, this cell is pretty
|
||||
small; all of its transistors have size $5\lambda$ is the smallest size that can be properly
|
||||
connected with a standard $2\lambda\times2\lambda$ via. Thus, when the ``write line'' (signal
|
||||
connected to the gates of the two outside transistors) is asserted, the charge from the
|
||||
surrounding bitlines can easily overpower the cell, causing it to switch to a different value.
|
||||
|
||||
\subsubsection{Details}
|
||||
There are few notable things about my cell design. Even though it was recommended that we only
|
||||
use metals one and two for the internal wiring, I went up to metal three for cross-connecting
|
||||
the two internal inverters. This was the only way I found to keep the height of the cell to
|
||||
minimum. This limited my routing options somewhat; to compensate, I also used metal three for
|
||||
the vertical wires, \textsc{Bt} and \textsc{Bf}. This allowed me to use metal four for the
|
||||
\textsc{Wl} (access) signal. Since this was the only use of metal four, I had enough free
|
||||
room to route thee additional \textsc{Wl} signals to the remaining three columns.
|
||||
|
||||
My general principle for designing the layout was that, in an 12-bit, 4-column design, \textbf{a single
|
||||
unit of height costs as much as 64 units of width}. Thus, I was fairly liberal with my layout's
|
||||
width, but made sure to minimize the height of the design. The most significant bottleneck
|
||||
was the gate oxide ``poking out'' of the ends of the design. In total, I was able to achieve
|
||||
a height of $30\lambda$ when arrayed.
|
||||
|
||||
Other designs with smaller height were possible, but I found them undesirable. For instance,
|
||||
Reed's now-famous design used a significant amount of high-level metals to achieve its tiny,
|
||||
almost square area. This, however, makes routing \textsc{Wl} signals fairly complicated. They either
|
||||
need to go to yet another layer of metal, or the decoder needs to be split into 4 pieces. The former
|
||||
is undesirable as per the requirements for this assignment; the latter incurs the cost of additional
|
||||
decoder hardware between columns, thereby significantly increasing the wire length and signal
|
||||
delays. Since delays incurred by the flip flops and other signals are already becoming
|
||||
a significant factor in my design, I thought it would be best to avoid such delays.
|
||||
|
||||
Other ideas I am aware of include putting \textit{all} the transistors in a single, horizontal line.
|
||||
While this certainly succeeds at reducing the height, it incurs all the same issues described
|
||||
above - it becomes nigh impossible to wire further \textsc{Wl} lines through each column,
|
||||
unless the decoder is split into bits, in which case the width of the entire assembly drastically increases,
|
||||
slowing down all signals.
|
||||
|
||||
\begin{figure}[h]
|
||||
\centering
|
||||
\includegraphics[width=0.5\linewidth]{layout_single.png}
|
||||
\caption{Electric layout for a single cell.}
|
||||
\label{fig:layout-cell}
|
||||
\end{figure}
|
||||
|
||||
\pagebreak
|
||||
My basic cell is shown in Figure \ref{fig:layout-cell}. The arrayed version (in Figure \ref{fig:layout-arrayed})
|
||||
merits additional explanation. In my earlier description of the overall design, I mentioned
|
||||
that I have precharge PMOS transistors. I have integrated these into my layout to accurately model
|
||||
my design. I also made them $10\lambda$ wide, since this is, at the time of writing,
|
||||
the size of my 4 precharge transistors. In the bird's eye view (Figure \ref{fig:layout-arrayed-far}),
|
||||
three things can be observed:
|
||||
\begin{itemize}
|
||||
\item \textit{Additional vertical line:} This line represents the clock signal,
|
||||
which must be fed to the precharge transistors. In the full design, there would
|
||||
be 5 clock lines (3 shared, and 2 on either side).
|
||||
\item \textit{``Empty'' space between nodes:} I left this space because I was not sure
|
||||
how wide I would end up making my \textsc{Bt} and \textsc{Bf} wires. I have measured
|
||||
the distance to ensure that the design will remain DRC clean with up to \textbf{$8\lambda$-wide bitlines}.
|
||||
This appears to be a sweet spot for my design, anyway.
|
||||
\item \textit{Moved well contacts:} I have moved my well contacts to the region between
|
||||
two columns. By extending the N- and P-wells to this area, I was able to
|
||||
share a single contact between two cells, leaving room for prechare transistors
|
||||
on both sides of the cell. This was partially inspired by Reed's compact cell design,
|
||||
which shared a single contact between two cells\footnote{I am operating based on your
|
||||
comment that well contacts for every cell are significantly overkill.}.
|
||||
\end{itemize}
|
||||
Figure \ref{fig:layout-arrayed-close} shows a closer view of the design. Due to the additional
|
||||
space incurred, an entire column is approximately $100\lambda$ wide.
|
||||
|
||||
\begin{figure}[h]
|
||||
\centering
|
||||
\begin{subfigure}{.5\textwidth}
|
||||
\centering
|
||||
\includegraphics[width=.7\linewidth]{layout_arrayed.png}
|
||||
\caption{Bird's eye view of the arrayed SRAM cells.}
|
||||
\label{fig:layout-arrayed-far}
|
||||
\end{subfigure}%
|
||||
\begin{subfigure}{.5\textwidth}
|
||||
\centering
|
||||
\includegraphics[width=.8\linewidth]{layout_arrayed_closeup.png}
|
||||
\caption{Close up from arrayed SRAM cells.}
|
||||
\label{fig:layout-arrayed-close}
|
||||
\end{subfigure}
|
||||
\caption{Read block schematics}
|
||||
\label{fig:layout-arrayed}
|
||||
\end{figure}
|
||||
|
||||
\pagebreak
|
||||
\section{Further Design Ideas}
|
||||
I discovered -- from other people in the class -- that an 8-column design was plausible.
|
||||
Unfortunately, I was only convinced a day or so before the project was due, which did not give me
|
||||
enough time to redesign my SRAM. I have seen students successfully using
|
||||
the 8-column design by sharing \textsc{Wl} wires for each 'row', and using
|
||||
the remaining 3 bits to enable and disable the write block. Since reading does
|
||||
not change the cell value, this is a viable approach; all 8 columns would ``read''
|
||||
(except during writing, in which 7 columns would read and 1 would write). As
|
||||
long as a proper address selection mechanism is implemented into the read collector
|
||||
circuit (which at present cannot handle concurrent reads), this would work just
|
||||
fine, albeit at the expense of added power consumption (from draining and re-charging
|
||||
7 extra wires). This design, combined with my idea of placing the write block
|
||||
in the middle of the column, can lead to very short effective wire lengths. If
|
||||
I was to approach this project again, that's what I would try.
|
||||
|
||||
\section{Acknowledgements}
|
||||
Reed's aforementioned idea of sharing well contacts between adjacent cells
|
||||
played a part in my design. Also, without the other students in the class
|
||||
Discord, I would not have known to use the ``better'' wire model at all.
|
||||
|
||||
\pagebreak
|
||||
\bibliographystyle{unsrt}
|
||||
\bibliography{bibliography}
|
||||
|
||||
\end{document}
|
||||
|
||||
@@ -21,17 +21,17 @@ Xnf fff gnd dead nn ww='number*5'
|
||||
|
||||
|
||||
*********begin: topLevel*****
|
||||
.param per = 1.33ns
|
||||
.param per = 1.3ns
|
||||
.param dataLead=per*0.1
|
||||
.param lw=2000
|
||||
.param lw=2200
|
||||
.param wirew=14
|
||||
|
||||
vdd vdd 0 'supply'
|
||||
|
||||
Xclok clk dat1 period='per' start='per+dataLead' total=1 duty=0.5 sz=300
|
||||
Xad ad dat1 period='per' start='per' total=1 duty=0.5 sz=300
|
||||
Xrdwr rdw dat1 period='3*per' start='2*per' total=2 duty=1 sz=300
|
||||
Xdii din dat1 period='3*per' start='per' total=4 duty=2 sz=300
|
||||
Xrdwr rdw dat1 period='per' start='2*per' total=2 duty=1 sz=300
|
||||
Xdii din dat1 period='per' start='per' total=4 duty=2 sz=300
|
||||
|
||||
Xinv1 clkb1 clk inv
|
||||
Xinv2 clkb2 clkb1 inv
|
||||
@@ -46,7 +46,7 @@ Xrdwff rdwf rdw clk flop
|
||||
Xrotff dotf dot clk flop
|
||||
Xdec choose adf clk decModel
|
||||
|
||||
Xwr bt3 bf3 dinf rdwf clkb6 iWrite1
|
||||
Xwr bt3 bf3 dinf rdwf adf clkb6 iWrite1
|
||||
Xw1 bt1 bt2 bf1 bf2 clk wire_precharge len='lw/4' wid='wirew'
|
||||
Xmd1 bt2 bf2 memLoad number=15
|
||||
Xw2 bt2 bt3 bf2 bf3 clk wire_precharge len='lw/4' wid='wirew'
|
||||
@@ -54,8 +54,10 @@ Xmd2 bt3 bf3 memLoad number=16
|
||||
Xw3 bt3 bt4 bf3 bf4 clk wire_precharge len='lw/4' wid='wirew'
|
||||
Xmd3 bt4 bf4 memLoad number=16
|
||||
Xw4 bt4 btt bf4 bff clk wire_precharge len='lw/4' wid='wirew'
|
||||
Xmd4 btt bff memLoad number =16
|
||||
Xla bt1 bf1 choose mem1
|
||||
Xmd4 bt3 bf3 memLoad number =16
|
||||
* Xla bt1 bf1 choose mem1
|
||||
* Xla bt3 bf3 choose mem1
|
||||
Xla btt bff choose mem1
|
||||
Xrd btt bff set rst rdwf clk choose iReadSub
|
||||
Xrc dot set rst vdd vdd vdd vdd vdd vdd readCollect
|
||||
|
||||
|
||||
@@ -1,5 +1,13 @@
|
||||
* [x] Figure out the weird opAmp behavior
|
||||
* [ ] Design cell with strict metal policies
|
||||
* [ ] Add precharger version of memory cell (or explain how they compose)
|
||||
* [ ] Test cell in the _middle_.
|
||||
* [ ] Walk through the consequences of the read/write block being in the middle.
|
||||
* [x] Design cell with strict metal policies
|
||||
* [x] Add precharger version of memory cell (or explain how they compose)
|
||||
* [x] Test cell in the _middle_.
|
||||
* [x] Walk through the consequences of the read/write block being in the middle.
|
||||
* [x] Figure out what to do with flopped write block.
|
||||
* [x] Test data close to write block (it pulls up past clock low!)
|
||||
* [ ] Drive wires to zero?
|
||||
* [x] Add missing well connection in layout
|
||||
* [x] Make sure width isn't too horrible
|
||||
* [ ] Model additional delay for read read/write block select?
|
||||
* [x] Model worst case of decoder
|
||||
* [x] Cite [this](https://ieeexplore.ieee.org/document/210039)
|
||||
|
||||
BIN
final/toplevel.png
Normal file
|
After Width: | Height: | Size: 149 KiB |
BIN
final/toplevel_design.png
Normal file
|
After Width: | Height: | Size: 192 KiB |
BIN
final/write.png
Normal file
|
After Width: | Height: | Size: 13 KiB |